The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2003

Filed:

Aug. 21, 2001
Applicant:
Inventors:

Frank Höller, Aalen, DE;

Martin Ross-Messemer, Essingen, DE;

Alexander Menck, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/36 ;
U.S. Cl.
CPC ...
G01T 1/36 ;
Abstract

A spectrometer arrangement is disclosed for the determination of a radiation wavelength of radiation emitted from a radiation source to be measured. The arrangement includes a diffraction grating on which the radiation of the radiation source to be measured is incident at a predetermined angle, wherein the diffraction grating is provided by a reflection grating having a variable lattice constant. The arrangement also includes a radiation detector for receiving from the radiation source to be measured radiation diffracted at a predetermined angle at the diffraction grating.


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