The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2003
Filed:
Apr. 17, 2002
Applicant:
Inventors:
Heribert Bucher, Tettnang, DE;
Bruno Riedter, Weingarten, DE;
Assignee:
Blum-Novotest GmbH, Grunkraut, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 1/110 ;
U.S. Cl.
CPC ...
G01B 1/110 ;
Abstract
The testing of a cutting-edge geometry of a tool takes place during time intervals that comprise time instants at which it is to be expected that a region, to be tested, of the tool enters a measuring beam. At time instants at which the tool does not enter the measuring beam, no measurements are performed, which increases the reliability of the test and avoids spurious measurements. For this purpose, a measuring system is used that preferably comprises programmable units in order to use the invention flexibly for various machine tools and tools without changing the construction of the measuring system.