The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2003

Filed:

Jan. 14, 2002
Applicant:
Inventors:

Cecil Aswell, Orangevale, CA (US);

John H. Berlien, Jr., Plano, TX (US);

Eugene G. Dierschke, Dallas, TX (US);

Lester L. Hodson, McKinney, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 3/100 ;
U.S. Cl.
CPC ...
H01L 3/100 ;
Abstract

A monolithic optical detector for determining spectral content of an incident light includes at least a first and second well in a substrate, the second well formed proximate the first well. The first well is configured to be exposed to incident light and for generating a first photocurrent as a function of the incident light. The second well is configured to be shielded from the incident light and for generating a second photocurrent as a function of the incident light. Lastly, a processing and control unit, responsive to the first and second photocurrents, determines an indication of spectral content of the incident light. A method and device parameter controller are also disclosed.


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