The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2003

Filed:

Mar. 30, 2001
Applicant:
Inventors:

Nanibhushan Dattagupta, San Diego, CA (US);

Ta-Chien Tseng, Miao-Li Hsin, TW;

Assignee:

Applied Gene Technologies, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; C12N 9/00 ; C07H 2/104 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; C12N 9/00 ; C07H 2/104 ;
Abstract

This invention relates generally to nucleic acid hybridization analysis. More specifically, a method for detecting a point mutation in a DNA strand is provided, which method uses, inter alia, a test nucleic acid strand complementary to a target DNA strand, said nucleic acid strand comprises a sufficient number of ribonucleotide residues that span the position of said point mutation to be detected to form a target DNA strand/test nucleic acid strand duplex and RNase H cleavage of said target DNA strand/test nucleic acid strand duplex. Kits and arrays for detecting a point mutation in a DNA strand comprising test nucleic acid strand comprising a sufficient number of ribonucleotide residues that span the position of said point mutation to be detected are also provided.


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