The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2003
Filed:
Feb. 07, 2001
Itsuji Minami, Omiya, JP;
Hitoshi Miyano, Omiya, JP;
Fuji Photo Optical Co., Ltd., Saitama, JP;
Abstract
This endoscope apparatus utilizes a phenomenon called “curvature of field” of a lens to satisfactorily bring a shape, into focus, of an object to be observed such as unevenness especially during enlargement in accordance with a shape of unevenness or the like of the object. For example, there is provided an objective lens group having two movable lenses, and variable-power is performed and field curvature characteristics are changed by moving these movable lenses. This change in the field curvature characteristics is performed by operating an image surface curving switch and driving the movable lenses through the use of an actuator or the like. Also, information on differences in height on the image central part to the peripheral part is operated from the amount of field curvature changed by the objective lens group to display the information on differences in height on the monitor. Further, the image information on the divided areas are compared, and when the entire image is in focus, a static image is formed and the information on differences in height is displayed.