The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2003
Filed:
Mar. 05, 2001
Applicant:
Inventor:
Yoshiei Hasegawa, Kanagawa-ken, JP;
Assignee:
Kabushiki Kaisha Nihon Micronics, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01R 1/118 ;
U.S. Cl.
CPC ...
H01R 1/118 ;
Abstract
An electrical contact technique for use in the semiconductor device inspection equipment is disclosed. There are used one or more pyramid-shaped contactors projecting toward an objective semiconductor device to be tested. The contactor is brought into contact with the projection electrode of the objective semiconductor device through the edge line or the slant surface thereof. Accordingly, only the side portion of the projection electrode is pressed by the edge line or the slant surface of the contactor, thus the projection electrode being prevented from being damaged at the tip portion thereof.