The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2003

Filed:

Jan. 27, 2000
Applicant:
Inventors:

Yukihiko Tanizawa, Kariya, JP;

Kazuaki Hamamoto, Nagoya, JP;

Inao Toyoda, Okazaki, JP;

Hiroaki Tanaka, Kariya, JP;

Yasutoshi Suzuki, Okazaki, JP;

Assignee:

Denso Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 9/04 ;
U.S. Cl.
CPC ...
G01L 9/04 ;
Abstract

A pressure detecting apparatus has a single-crystal semiconductor sensor chip disposed on a metallic diaphragm through a low melting point glass. The sensor chip has a planar shape selected from a circular shape, a first polygonal shape having more than five sides and having interior angles all less than 180&deg;, and a second polygonal shape having a ratio of a circumscribed circle diameter relative to an inscribed circle diameter being less than 1.2. Four strain gauge resistors are disposed on X, Y axes passing through a center point O of the sensor chip in parallel with <110> directions. Accordingly, thermal stress is reduced not to adversely affect a detection error and simultaneously high sensitivity is provided.


Find Patent Forward Citations

Tanizawa, Yukihiko. (2003). Pressure detecting apparatus with metallic diaphragm (U.S. Patent No. 6595065). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6595065

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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