The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2003

Filed:

Jun. 21, 2001
Applicant:
Inventors:

Bernd Wunderer, Munich, DE;

Ulrich Schanda, Holzkirchen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/904 ;
U.S. Cl.
CPC ...
G01N 2/904 ;
Abstract

A method for determining structural inhomogeneities in sheet material including exposing sheet material to ultrasonic waves, measuring ultrasonic waves transmitted through the sheet material and ultrasonic waves reflected from the sheet material at a plurality of predetermined portions located linearly along at least one track disposed on the sheet material and producing at least one value characteristic based on at least the transmitted or reflected ultrasonic waves from each of the predetermined portions on the at least one track. The method further includes forming a first mean based on the at least one value characteristic and a second mean based on the first mean to determine the structural inhomogeneities in the sheet material representative of the at least one track.


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