The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2003
Filed:
Sep. 28, 1999
David Ungar, Palo Alto, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A method and apparatus for testing processes in a computer system are described. In a software process, there exist many test points in the execution of the process where stress testing may be applied. The process is executed with stress testing applied at selected test points and test intervals. The selected test points are based on prime numbers and varied for successive execution iterations. An efficient distribution of evaluated test points is achieved, and all possible test points are ultimately evaluated within a small number of execution iterations. In one embodiment, the total number of test points is first determined. A first execution run is evaluated at selected test points that correspond to prime numbers greater than the square root of the total number of test points. Subsequent execution iterations are then performed evaluating test points at selected test intervals, where the test intervals for respective execution iterations correspond to prime numbers less than or equal to the square root of the total number of test points. The prime numbers for the selected test intervals are chosen in decreasing order, for example.