The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2003
Filed:
May. 12, 2000
Applicant:
Inventors:
Marc Alexander Najork, Palo Alto, CA (US);
Clark Allan Heydon, San Francisco, CA (US);
Michael Mitzenmacher, Belmont, MA (US);
Monika H. Henzinger, Menlo Park, CA (US);
Assignee:
Hewlett-Packard Development Company, LP., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/516 ;
U.S. Cl.
CPC ...
G06F 1/516 ;
Abstract
A system generates a list of near-uniform samples of data sets (e.g., web pages) from among a plurality of host computers. The system performs a random walk so as to generate a set of visited addresses. For each address in the set, a reachability measure is computed. Then, samples are selected from the set, such that the probability of selecting a given address is inversely proportional to the reachability measure for the address. The selected samples form the list of near-uniform samples.