The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2003

Filed:

Nov. 27, 2000
Applicant:
Inventors:

Masato Kanao, Hachioji, JP;

Gakuji Higuchi, Ina, JP;

Atsushi Yonetani, Tama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/100 ;
U.S. Cl.
CPC ...
G02B 2/100 ;
Abstract

A microscope includes a column which stands upright on a base, an LED light source, a stage for placing a specimen irradiated with light from the LED light source, a lens barrel which is arranged to face the specimen on the stage, and has an observation optical system for acquiring the observation image of the specimen, an image sensing element which is arranged at the imaging position of the observation optical system of the lens barrel, and senses the observation image of the specimen, a monitor for displaying the observation image sensed by the image sensing element, and a recording unit for recording image data of the observation image sensed by the image sensing element. At least the LED light source, stage, observation optical system, and image sensing element are arranged along the optical axis of the observation optical system, and supported along the column.


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