The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2003
Filed:
Mar. 16, 2001
Dirk Muehlhoff, Jena, DE;
Guenther Rudolph, Jena, DE;
Stefan Schmidt, Jena, DE;
Gerhard Doering, Schloeben, DE;
Guenter Berthel, Jena, DE;
Thomas Hartmann, Jena, DE;
Carl Zeiss Jena GmbH, Jena, DE;
Abstract
A method and an arrangement for detecting the position of the plane XY of an object, which plane XY is to be scanned, and for its positioning in the focal plane X′Y′ of a laser scanner, preferably for a laser scanning microscope. According to the disclosure, it is provided in a method of the type described above that, after a rough orientation of the object carried out by placing on an object holder, a laser beam is directed successively in time to at least three different points P , P . . . P located in the scan plane XY of the object and, in doing so, each of the reflections proceeding from the points P , P . . . P is imaged on a position-sensitive detector, an actual position value is determined at the detector for each reflection and is compared with a stored reference position value, adjustment commands for changing the inclination of the object holder are obtained from the deviations of the actual position values from the reference position values, and the inclination of the object holder is changed on the basis of these adjustment commands until points P , P . . . P are located in the focal plane X′Y′ of the laser scanner.