The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2003

Filed:

Oct. 30, 1998
Applicant:
Inventor:

Stanley C. Perino, Ft. Collins, CO (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/700 ;
U.S. Cl.
CPC ...
H04N 1/700 ;
Abstract

A multi-threshold optical binning method for classifying the image quality of an optical sensor is presented. In accordance with the invention, a sensor tester causes a sensor pixel image to be generated by a sensor under test. The sensor pixel image is comprised of a plurality of pixels, each represented by an associated quantized intensity level. The quantized intensity level of a pixel may fall into one of a first pixel class, a second pixel class, or a third pixel class, for example, a dark pixel class, a dim pixel class, and an acceptable pixel class. An image filter processes the sensor pixel image, filtering but all pixels that fall within the acceptable pixel class, to generate a defective pixel map. The defective pixel map includes those pixels which have a quantized intensity level that falls within the first and/or second pixel class but not the third pixel class.


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