The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2003

Filed:

May. 17, 2000
Applicant:
Inventors:

Johan Van Den Brink, Eindhoven, NL;

Romhild Martijn Hoogeveen, Eindhoven, NL;

Paulus Johannes Maria Folkers, Eindhoven, NL;

Klaas Paul Pruessmann, Zurich, CH;

Markus Weiger, Dietikon, CH;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

The degree of sub-sampling in magnetic resonance imaging is such that the ensuing acquisition time for receiving (echo) series of magnetic resonance signals due to an individual RF excitation is shorter than the decay time of such magnetic resonance signals. Preferably, a segmented scan of the k space is performed, the number of segments and the number of lines scanned in each segment being adjustable and a predetermined total number of lines being scanned. Preferably, a small number of segments is used such that the acquisition time for receiving the magnetic resonance signals for the complete magnetic resonance image is shorter than the process time of the dynamic process involved.


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