The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2003
Filed:
Mar. 15, 2001
Gengsheng Lawrence Zeng, Sandy, UT (US);
Daniel Gagnon, Twinsburg, OH (US);
Koninklijke Philips Electronics, N.V., Eindhoven, NL;
Abstract
A subject ( ) is disposed adjacent a linear detector array ( ) of a nuclear camera. The subject ( ) is injected with a radioactive isotope ( ) and y-ray emissions indicative of nuclear decay are detected at the detector array ( ) as the detector array rotates about an axis of rotation to collect data over a circular field of view. Detectors farther from the axis rotation are sampled at a higher sampling rate such that the are sampled after a generally constant arc of rotation to correct for angular aliasing. The detector array ( ) rotates about the axis of rotation in a 1/sin &THgr; pattern with angular offset of the detector array from a longitudinal axis of the subject. This corrects for otherwise uneven sampling. A reconstruction processor ( ) reconstructs the identifications of the y-ray receiving detectors, or other indicators of event detection location, and the digital peak values to generate a spherical image representation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile