The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2003
Filed:
Mar. 23, 2001
Yuki Kawakita, Yokkaichi, JP;
Takuya Inoue, Yokkaichi, JP;
Sumitomo Wiring Systems, Ltd., Yokkaichi, JP;
Abstract
A bend-test device for wire harnesses capable of handling a plurality of samples at the same time. The bend-test device includes a fixed frame unit, a hinge unit with a fulcrum axis, and a mobile frame unit connected to the fixed frame unit via the hinge unit in a freely pivotable manner around the fulcrum axis. The fixed frame unit includes fixed-side panels respectively including holder holes, each of which holds a grommet carrying a wire harness. The fixed-side panels are arranged in a parallel relation to each other, and aligned perpendicular to the direction of the fulcrum axis, in a freely mountable and removable manner. Likewise, the mobile frame unit includes mobile-side panels respectively including holder holes, each of which holds another grommet carrying the wire harness. The mobile-side panels are arranged as mentioned above, so that each of the mobile-side panels can be opposed to a corresponding one among the fixed-side panels. The bend-test device further includes a pivoting mechanism for reciprocatingly pivoting the mobile frame unit relative to the fixed frame unit around the fulcrum axis of the hinge unit.