The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2003
Filed:
Apr. 22, 2002
Takashi Shimada, Tokyo, JP;
Shinichi Hattori, Tokyo, JP;
Takahiro Sakamoto, Tokyo, JP;
Syuichi Nakamura, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A nondestructive inspection apparatus includes a vibrating section which is adapted to be placed in pressure contact with a surface of a measuring object for generating an acoustic elastic wave W, a receiving section for receiving a reflected wave, a pushing mechanism for pushing the vibrating section and the receiving section against the measuring object, a pushing force measurement section for detecting pushing forces Fa, Fb during vibration, a vibration control section for driving the vibrating section, and a reception signal processing section for determining the internal defect based on a reception signal R. The reception signal processing section includes a reflection energy calculation section for calculating a reflection energy level due to elasticity vibration of the measuring object, a reflection energy correction section for normalizing the reflection energy level by the pushing force to calculate a correction value; and an internal defect determination section for detecting the internal defect based on the correction value. With this arrangement, the absolute reflection energy level of the reflected wave is determined through comparison, thereby making it possible to improve the evaluation accuracy of the internal defect to a substantial extent.