The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2003
Filed:
Oct. 09, 1998
Neville Pattinson, Austin, TX (US);
Tibor Somogyi, Verrieres le Buisson, FR;
Jean-Marc Pietrzyk, Paris, FR;
Bertrand Du Castel, Austin, TX (US);
Schlumberger Industries, SA, , FR;
Abstract
A metrology device incorporates a programmable smart card. The smart card may be a Java programmable smart card and allows the metrology device to access Java applications and resources while still retaining independent control over its metrological functions. A smart card interface allows the smart card and metrological device to communicate with each other using the ISO 7816 protocol. The smart card may be external to the metrology device, or it may be fixedly installed in the metrology device. Java applications may be pre-loaded or downloaded on the smart card. The metrological device may select which applications to be run on the smart card. The smart card may have an enhanced operating system that includes various metrological functions as native functions. Alternatively, the metrological functions may be included as part of a Java class library which may be accessed by the operating system or Java applications.