The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2003

Filed:

Jul. 13, 1999
Applicant:
Inventors:

Nima Brardjanian, Eatontown, NJ (US);

Yong J. Lee, Holmdel, NJ (US);

Walid E. Nabhane, Eatontown, NJ (US);

Mohsen Sarraf, Rumson, NJ (US);

Sheng-Jen Tsai, Bridgewater, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03D 3/02 ;
U.S. Cl.
CPC ...
H03D 3/02 ;
Abstract

A simplified method for frequency offset estimation in a TDMA cellular PCS environment using &pgr;/4-shifted DQPSK comprises the steps of multiplying a complex conjugate of a received complex-valued symbol and a succeeding symbol to produce a comparison vector having an angle equal to the phase angle between the received complex-valued symbol and the succeeding symbol, rotating the comparison vector so that the angle thereof is between 0° and 90°, and estimating the frequency offset by determining a constant deviation of the phase angle from an ideal phase angle value of 45° by calculating an average phase angle for a plurality of successive comparison vectors or correlating the rotated comparision vector against a bank of unit vectors to determine a maximum correlation.


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