The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2003

Filed:

Aug. 01, 1994
Applicant:
Inventors:

Eiji Ogura, Saitama, JP;

Masatoshi Takashima, Tokyo, JP;

Keitaro Yamashita, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 ;
U.S. Cl.
CPC ...
H04N 7/18 ;
Abstract

A reference block is divided in the horizontal direction into small blocks, and is also divided in the vertical direction into small blocks. Feature values representing each of the small blocks formed from the reference block are obtained. Similarly, a check block is divided in the horizontal and vertical directions into small blocks and feature values representing the small blocks formed from the check block are obtained. The feature values in the horizontal direction of the reference and check blocks are compared, and the feature values in the vertical direction of the reference and check blocks are compared. The results of the two comparisons comprise an evaluation value by which the degree of matching of the reference and check blocks is evaluated. The check block is moved throughout a predetermined search range, and the process is repeated for each position of the check block. A motion vector is produced between the reference block and the check block position at which the check block best matches the reference block.


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