The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2003
Filed:
Oct. 21, 1997
Applicant:
Inventors:
Takehiko Nakai, Kawasaki, JP;
Michitaka Setani, Kawasaki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F21V 9/04 ;
U.S. Cl.
CPC ...
F21V 9/04 ;
Abstract
In a lens system having one or a plurality of diffracting surfaces and one or a plurality of refracting surfaces, a power of each surface and a distance between the surfaces are set such that an optical characteristic of the lens system, such as a focal length (focal point) and/or a spherical aberration, remains substantially unvarying relative to temperature variations within a predetermined range and that an achromatic effect is substantially attained for the focal length (focal point) and/or the spherical aberration within a predetermined region of wavelength.