The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2003

Filed:

Dec. 07, 1999
Applicant:
Inventors:

Rainer Huber, Piding, DE;

Junli Sun, Raubling-Nickelheim, DE;

Bernd Leitner, Neubeuern, DE;

Hans Steinbichler, Neubeuern, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

A method serves the direct phase-angle measurement of radiation, in particular of light radiation which is reflected from a body. The body is exposed to coherent radiation. The radiation reflected from the body is imaged by an imaging optical system ( ) in an image plane in which a sensor is located. A reference radiation generated in accordance with the shearing method is superimposed on the sensor. The phase of the radiation from the body is determined from the measurement signals of the sensor. To improve such a method, the imaging optical system ( ) possesses a diaphragm ( ) having one or two apertures ( ) (FIG. ).


Find Patent Forward Citations

Huber, Rainer. (2003). Imaging optical system for direct phase-angle measurement of radiation (U.S. Patent No. 6590668). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6590668

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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