The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2003
Filed:
Nov. 30, 1999
James Wichelman, Fort Collins, CO (US);
Eric N. Flink, Loveland, CO (US);
Craig Chamberlain, Louisville, CO (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A channel plan and a corresponding test plan are implemented in connection with a plurality of nodes that communicate signals. The channel plan enables a monitoring system to conduct automatic periodic test plans, comprising tests, on the nodes, based upon data specified in the channel plan. Each test plan prescribes measurement of at least one signal parameter, pertaining to one or more nodes and/or to one or more channels contained within the nodes. The monitoring system includes a spectrum analyzer, a switch enabling the spectrum analyzer to interface with the nodes, and a controller. Navigation interface logic is configured to generate a universal interface component on the display device, one or more group level interface components on the display device, one or more node level interface components on the display device, and one or more channel level interface components on the display device.