The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6590571 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 08, 2003

Filed:

Apr. 11, 2001
Applicant:
Inventors:

Franck Laffargue, Poissy, FR;

Roy Van Dijk, Eindhoven, NL;

Jurgen Jean Louis Hoppenbrouwers, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/00 ;
U.S. Cl.
CPC ...
G09G 5/00 ;
Abstract

Method of calculating new luminance value data based on original luminance value data to be displayed on a matrix display device, where luminance value data are coded in sub-fields, and double-line addressing for the least significant sub-fields is used for reducing the addressing time. A reduction of the difference between the new data and the original data is obtained by computing a new common value for the least significant sub-fields of a set of neighboring or adjacent lines, and new values for the most significant sub-fields of each line of said set of adjacent lines. The method comprises embodiments which are applicable to both binary and non-binary sub-fields.


Find Patent Forward Citations

Laffargue, Franck. (2003). Method of reducing errors in displays using double-line sub-field addressing (U.S. Patent No. 6590571). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6590571

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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