The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2003

Filed:

Oct. 12, 2001
Applicant:
Inventors:

Toshio Okuno, Kanagawa-ken, JP;

Gunji Mizutani, Tokyo, JP;

Masatomo Nagashima, Kanagawa-ken, JP;

Tadashi Furumi, Mishima-machi, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract

An apparatus for inspecting a display board or a circuit board in which an inspection terminal of an inspection probe block B is pressed into contact with an electrode pad of a display board or a circuit portion P for inspection. A probe block supporting frame member has an expandable and contractible structure, and when the probe block supporting frame member is expanded, a board supporting frame member can be relatively advanced. Due to the relative advancement of the board supporting frame member , the display board or the circuit board P protrudes forward of a distal end of the terminal of the probe block B through an enlarged opening area of the probe supporting frame member , so that the display board or the circuit board P supported on the board supporting frame member can be exchanged with another board.


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