The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2003
Filed:
Jan. 23, 2002
Jean-François Le Gargasson, Villiers S/Marne, FR;
Pierre Lena, Paris, FR;
Claude Boccara, Paris, FR;
Arnaud Dubois, Les Ulis, FR;
Universite Paris 7-Denis Diderot, Paris, FR;
Abstract
The invention concerns a device for observing a body, in particular a viewer, comprising means for illuminating ( ) the body ( ), means for sampling ( ) light coming from an illuminated site ( ) of the body and compensating means ( ) for measuring a deformation of the wave front of a beam coming from a point of the body ( ) and for applying to the light sampled by the sampling means ( ) a correction calculated on the basis of said measured deformation. The invention is characterised in that the sampling means and the compensating means are arranged such that, for each point of the body used for calculating the correction, the sampling means sample the light on a selected zone of the body near enough to said calculation point for the deformation of the wave front of the light coming from any point of that zone should be the same as that coming from the point of calculation more or less within a wavelength fraction, and the device includes means ( ) for automatically changing the point of the body ( ) used for the calculation of correction and for changing synchronously the associated sampling zone, such that the device scans the observed body by way of a series of such successive zones for each of which the deformation of the wave front derived from any point in the zone is identical, more or less within a wavelength fraction, to the deformation of the wave front derived from the associated point of calculation.