The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Aug. 28, 2001
Benjamin Mbouombouo, San Jose, CA (US);
Sudhakar Sabada, Sunnyvale, CA (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
An improved metal stack strategy is disclosed. A first aspect of the present invention provides a method for defining an optimized metal stack option based on critical path information. The method and system use interconnect data from timing critical paths from at least one previous design to generate interconnect statistical data. The interconnect statistical data is then used to vary physical properties of interconnects in a current design during simulation until optimum performance is achieved. A second aspect of the present invention provides a method for reusing an ASIC core design with different metal stack options. This method defines x common metal layers across at least two metal stack options, where interconnects on each of the metal layers have common physical and electrical characteristics. An ASIC core design based on the x common metal layers is also defined, thereby making the ASIC core compatible with the different metal stack options. Given custom ASIC designs, each having a total of y metal layers where y>x, respective custom ASICS may then be fabricated using the ASIC core design and different metal stack options.