The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2003

Filed:

Sep. 05, 2000
Applicant:
Inventors:

Weng F. Lee, Penang, MY;

Colin S. Bill, Cupertino, CA (US);

Feng Pan, San Jose, CA (US);

Edward V. Bautista, Santa Clara, CA (US);

Azrul Halim, Santa Clara, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract

There is provided a tester interface circuit for use with a BIST state machine and a method for micro-architectural implementation of the same so as to enable cycling through a BIST test. The tester interface circuit includes a storage device, a logic decoder, a set/clear mechanism, and a polling logic device. The tester interface circuit is implemented with a minimum amount of chip area on a semiconductor IC.


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