The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Aug. 02, 2001
Fred Schleifer, Prior Lake, MN (US);
John Drinkard, Redwood City, CA (US);
Christopher Alan Dums, Clayton, NC (US);
Scientific Technologies Incorporated, Redwood City, CA (US);
Abstract
A circuit generates a test signal useful in verifying the actual delay values of individual delay stages in a digital delay line. In general, the cumulative delay of the delay line defines a window in time having its zero point anchored to the beginning of the delay line. Successive delay stages correspond to successive time bins within the overall time window. The test signal shifts at a known, linear rate in time with respect to a reference signal, which is used to initiate a test cycle. The reference signal synchronizes sampling of the test signal to the beginning of the time window. Samples of the test signal are taken at sample points determined by the actual time delays in the successive delay stages. The observed distribution of test signal edges across the time window may be used to determine the actual delay intervals of the delay line.