The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2003

Filed:

Nov. 13, 2000
Applicant:
Inventors:

Thomas Guth, Böbingen, DE;

Bernd Czepan, Heidenheim, DE;

Assignee:

Carl-Zeiss-Stiftung, Oberkochen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/124 ;
U.S. Cl.
CPC ...
G01B 1/124 ;
Abstract

The invention relates to a coordinate measurement device comprising a stylus ( ) which can be displaced in the coordinate directions (x, y, z) for sampling a workpiece ( ), a mechanism ( ) with drive units by means of which the stylus can be moved and a control unit ( ) for controlling the mechanism. To define the points (pk ) to be sampled on the workpiece, parameters of geometric elements (k k e e ) and parameters of the points (pk pk pe pe ) to be sampled on the corresponding geometric elements are memorized. To be able to modify the measurement sequence of such a coordinate measurement device more easily, the invention provides for the parameters of the points (pk ) to be sampled on a particular geometric element to be memorized separately in relation to a coordinate system (xk yk zk ) which is specific to the corresponding geornetric element (k ).


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