The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
May. 28, 1999
Kerwin D. Kanago, Veradale, WA (US);
David L. Platt, Veradale, WA (US);
James B. Summers, Spokane, WA (US);
Melvin D. Humpherys, Spokane, WA (US);
Richard P. Ryan, Spokane, WA (US);
Matthew Johnson, Half Moon Bay, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
An RF test set having a concurrent measurement architecture is provided. The RF test set is adapted for testing an RF communications device such as a cellular phone according to a set of RF tests. An RF source and an RF receiver are used to communicate with the cellular phone in order to perform the call processing operations to control the cellular phone while performing parametric measurements according to the RF tests. Concurrent measurements allow operation of concurrent measurement processes and call processing operations to take place in the RF test set in order to decrease the time required for each RF test and to increase measurement throughput of the RF test set.