The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Nov. 29, 2001
Applicant:
Inventors:
Shoichi Aoki, Tokyo, JP;
Sinya Nagashima, Tokyo, JP;
Assignee:
Ando Electric Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/26 ; G02B 6/42 ;
U.S. Cl.
CPC ...
G02B 6/26 ; G02B 6/42 ;
Abstract
An apparatus for measuring the chromatic dispersion profile of an optical fiber using two light sources and at least one of which is tunable in wavelength, in which two light beams of different wavelengths from said two light sources are injected into a optical fiber under test and the four-wave mixing light that is generated by interaction between said light beams of different wavelengths is measured with an optical time domain reflectometer (OTDR) characterized in that an optical bandpass filter having a fixed central frequency is provided at a stage upstream of said optical time domain reflectometer (OTDR).