The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Aug. 08, 2001
Applicant:
Inventors:
Sanjay J. Nichani, Natick, MA (US);
Joseph Scola, Medfield, MA (US);
Assignee:
Cognex Corporation, Natick, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/50 ;
U.S. Cl.
CPC ...
G06T 5/50 ;
Abstract
Machine vision methods for inspection of semiconductor die lead frames include the steps of generating a first image of the lead frame, generating a second image of the lead frame and any defect thereon, and subtracting the second image from the first image. The methods are characterized in that the second image is generated such that subtraction of it from the first image emphasizes the defect with respect to the lead frame.
Nichani, Sanjay. (2003). Semiconductor device image inspection with contrast enhancement (U.S. Patent No. 6587582). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6587582
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile