The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2003

Filed:

Feb. 11, 2002
Applicant:
Inventor:

Shiro Oikawa, Shiga-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/300 ; A61B 6/00 ;
U.S. Cl.
CPC ...
G01N 2/300 ; A61B 6/00 ;
Abstract

An X-ray tube and an X-ray area detector are driven synchronously in scanning action to revolve about a scan axis extending substantially through the center of a region of interest of an object under examination. An image processor performs a predetermined image processing on projection data detected in each scan position. In the image processing, a low-pass filtering is applied to projection data in each row of pixels of the area detector perpendicular to a direction corresponding to the scan axis, the low-pass filtering being in accordance with a location on the scan axis to which each row of pixels is projected. This filtering reduces artifacts due to a volume scan mode appearing in three-dimensional volume data of the region of interest generated by projecting the projection data after the low-pass filtering back to a virtual three-dimensional lattice.


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