The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Dec. 20, 2001
Applicant:
Inventors:
John Border, Walworth, NY (US);
Susan H. Bernegger, Fairport, NY (US);
John C. Pulver, Spencerport, NY (US);
Morgan A. Smith, Rochester, NY (US);
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/710 ;
U.S. Cl.
CPC ...
G02B 2/710 ;
Abstract
A double-sided microlens array and method has a plurality of first microlenses on a first surface opposite a plurality of second microlenses on a second surface of a transparent medium. At least two optical features are arranged on either of the first or second surfaces to form fiducial marks on the opposing surface in the transparent medium. The fiducial marks enable precise alignment of the microlenses in the first and second plurality of microlens arrays.