The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Feb. 14, 2001
Applicant:
Inventors:
Ulrich Riebel, Briesen, DE;
Udo Kraeuter, Leverkusen, DE;
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/502 ;
U.S. Cl.
CPC ...
G01N 1/502 ;
Abstract
The invention relates to a process for measuring particle size by measuring the attenuation of radiation after its passage through a defined measuring section containing a disperse system. According to the invention the temporally fluctuating transmission signal is recorded with variable time or spatial resolution. The transmission signals recorded then undergo a non-linear operation. The result of that non-linear operation is represented and analyzed as a spectral curve, i.e., as a function of the spatial or temporal resolution.