The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Feb. 01, 2001
John Hefti, San Francisco, CA (US);
Hong Peng, Fremont, CA (US);
Signature BioScience, Inc., San Francisco, CA (US);
Abstract
A system and method for detecting a molecular event in a test sample using a resonant test structure is presented. The method includes providing a resonant test structure having a resonant response associated therewith. Next, a first resonant response of the resonant test structure is obtained when the resonant test structure is electromagnetically coupled to a reference sample, the reference sample having a known composition. A second resonant response is also obtained when the resonant test structure is electromagnetically coupled to the test sample, the test sample having an unknown composition. Subsequently, one or more first electrical parameters, such as the q-factor of the resonator, are derived from the first resonant response. One or more second electrical parameters are similarly derived from the second resonant response. The similarity or difference between the first and second electrical parameters are analyzed to determine the presence or absence of the molecular event in the test sample.