The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2003

Filed:

May. 15, 2001
Applicant:
Inventor:

Takashi Seike, Ehime-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/306 ;
U.S. Cl.
CPC ...
G01R 3/306 ;
Abstract

A non-contact type current measuring instrument includes an armoring member having a pair of guide portions for a conductor under measurement that form therebetween a guide path with an open end; a magnetic core ring for seizing a magnetic flux that has an open space, is embedded in the armoring member, and comprises a semicircular portion, a pair of straight portions continuous to opposite ends of the semicircular portion and parallel to the guide path and a pair of projecting portions continuous to inside edges of the straight portions and bent so as to face each other and be perpendicular to the guide path; and Hall elements each inserted into and brought into intimate contact with an end face of each of the projecting portions, the conductor being inserted via the open end into the guide path and disposed within the core ring. An electric current passing through the conductor is detected by converging on the core ring a magnetic flux generated by the electric current and utilizing the Hall effect of the Hall elements.


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