The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Jan. 03, 2000
Applicant:
Inventors:
Ansgar Haking, Eppelheim, DE;
Karsten Richter, Ketsch, DE;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 3/707 ; H01J 2/600 ; H01J 2/6295 ; G21N 2/300 ;
U.S. Cl.
CPC ...
H01J 3/707 ; H01J 2/600 ; H01J 2/6295 ; G21N 2/300 ;
Abstract
A method for detecting an element in a sample using a transmission electron microscope to measure a first image of the intensities of the sample at an energy loss in the range of the element signal. The background at various points is determined in a comparator sample which does not contain the element intensity. Energy loss is determined at the front of the element signal, and an energy loss is determined in the range of the element signal. From these values an approximation function is calculated so that an image of the pure element-specific intensities can be calculated.