The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Nov. 20, 2000
Applicant:
Inventors:
Edward P. Furlani, Lancaster, NY (US);
Marek W. Kowarz, Rochester, NY (US);
John R. Debesis, Penfield, NY (US);
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/24 ;
U.S. Cl.
CPC ...
G01L 1/24 ;
Abstract
An optical strain gauge for measuring the strain in a structural member includes a mechanical grating device fixedly attached to the structural member for modulating an incident beam of light by diffraction; at least one source of light; and an optical system for directing light onto the mechanical grating device and a sensor for receiving light reflected from the mechanical grating device for producing a representation of the strain in the structural member.