The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2003

Filed:

Jan. 10, 2001
Applicant:
Inventors:

Samuel M. Haugland, Houston, TX (US);

Teruhiko Hagiwara, Houston, TX (US);

Martin Paulk, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/40 ;
U.S. Cl.
CPC ...
G01V 1/40 ;
Abstract

A method of compensating for tool motion is disclosed. In one embodiment, the method includes passing a logging tool through a borehole, obtaining a series of tool response measurements, and obtaining a series of tool position measurements associated with the tool response measurements. The tool position measurements preferably indicate the distance between the tool axis and the borehole axis. The tool position measurements are preferably examined to determine if the tool was moving while the tool was making measurements. For measurements made while the tool was moving, the measurement time interval is preferably divided into subintervals each having a corresponding tool position. A formation property (such as resistivity) is estimated, and the expected tool response for each tool position is calculated. The expected tool responses are combined to form a model tool response, that is, the tool response that might be expected for a tool in motion. The model tool response is then compared to the measured tool response. The estimate of the formation property is adjusted and the process is repeated until the model tool response is substantially equal to the measured tool response.


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