The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2003
Filed:
Jul. 19, 1999
Paul J. Kane, Rochester, NY (US);
Theodore F. Bouk, Rochester, NY (US);
Peter D. Burns, Fairport, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method and a computer program for determining at least one component of a noise pattern of an imaging device. The method comprises the steps of: providing flat field data; forming a preliminary estimate of banding components by computing one-dimensional averages of the flat field data and carrying out a Fourier analysis of the one dimensional averages; determining the banding components by carrying out a two-dimensional Fourier analysis of the original flat field data, and comparing the result to the preliminary estimate; removing the banding components from the flat field data, to obtain modified flat field data; forming a second preliminary estimate of streaking components by carrying out a Fourier analysis on the modified flat field data; determining the two-dimensional random noise statistics by carrying out a Fourier analysis on the modified flat field data; and determining the streaking components by modifying the preliminary estimate of the streaking components with the two-dimensional random noise statistics.