The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2003
Filed:
Aug. 08, 2000
Applicant:
Inventor:
Wilbur C. Vogley, Missouri City, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract
An integrated circuit device test arrangement includes a plurality of microcomputers. Each of the microcomputers is interconnected directly through a separate test socket to a separate integrated circuit device that is inserted into the test socket. A device tester is coupled to the plurality of microcomputers for transmitting information between the device tester and the plurality of microcomputers. Each microcomputer contains instructions and data for performing a test routine on the associated integrated circuit device and transmitting selected results of the test routine to the tester.