The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2003

Filed:

Dec. 20, 2001
Applicant:
Inventors:

Carsten Henning, Recklinghausen, DE;

Matthias Hausmann, Dortmund, DE;

Juergen Wittekind, Frankfurt, DE;

Andreas Kuehnel, Oberursel, DE;

Heinrich Kladders, Muelheim, DE;

Heiko Rengel, Ober-Olm, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/762 ; G01R 3/108 ;
U.S. Cl.
CPC ...
G01N 2/762 ; G01R 3/108 ;
Abstract

The invention relates to a process and an apparatus for detecting gas-permeable damaged points in an electrically non-conductive layer which can exist as a single layer or as a multi-layer composite with at least one conductive layer, which process can be used for containers or packaging of pharmacological preparations to determine their integrity after storage.


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Henning, Carsten. (2003). Process and apparatus for testing multi-layer composites and containers produced therefrom (U.S. Patent No. 6583627). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6583627

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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