The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2003

Filed:

Aug. 28, 2001
Applicant:
Inventors:

Gerald C. LeVert, Knoxville, TN (US);

Francis E. LeVert, Knoxville, TN (US);

Assignee:

Kemp Corporation, Knoxville, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/772 ; G01R 3/309 ; G01R 3/312 ; G01B 7/24 ;
U.S. Cl.
CPC ...
G01N 2/772 ; G01R 3/309 ; G01R 3/312 ; G01B 7/24 ;
Abstract

A Barkhausen probe includes a magnetizing field generator, a magnetoresistive magnetic field sensor, a direct current power supply for biasing the magnetoresistive magnetic field sensor and signal conditioning electronics. The Barkhausen probe is capable of generating and sensing the Barkhausen noise emanating from the surface of a cyclic magnetized specimen. The conditioned Barkhausen noise output of the signal conditioning electronics is usable as input to various analysis systems where textural analysis of the material can be performed.


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