The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2003
Filed:
Apr. 24, 2001
Applicant:
Inventors:
William David Dunfee, New Castle, DE (US);
Bruce McLean Gemmell, Wilmington, DE (US);
Edward Stephen Kaminski, Elkton, MD (US);
John Charles Mazza, Newark, DE (US);
Edward Francis Farina, Oxford, PA (US);
Frank Stephen Krufka, Kirkwood, PA (US);
Assignee:
Dade Microscan Inc., West Sacramento, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/18 ;
U.S. Cl.
CPC ...
C12Q 1/18 ;
Abstract
Performing antibiotic testing on samples contained in test arrays by orienting the arrays relative to the direction of gravity so that test solution within the microwells is drawn downwards and air within the microwells is forced to the uppermost portion of the test array. Antibiotic testing is conducted using an interrogating beam of radiation passing horizontally through the microwells at locations devoid of air bubbles.