The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2003
Filed:
Oct. 22, 1999
Wolfgang M. Strobel, Tolland, CT (US);
Robert J. Lockhart, Deep River, CT (US);
Gerber Scientific Products, Inc., Manchester, CT (US);
Abstract
A method of cutting planar material with a controlled cutting machine having a cutting tool with a tool tip includes performing a cutting test on various planar materials with the cutting machine under selected cutting conditions which produce deflection forces on the cutting tool due to the interaction of the cutting tool and materials so as to cause the tool tip to offset and move along deviated or offset cutting paths relative to desired cutting paths, and determining compensating offsets in order to align and coincide the actual cutting paths with the desired cutting paths A schedule of the compensating offsets to align and coincide the actual cutting paths with the desired cutting paths is established as determined by the cutting tests. The schedule is to be repeatedly used thereafter for cutting planar material having cutting conditions associated with the schedule. Planar material is cut thereafter along desired cutting paths by advancing the cutting tool and planar material relative to one another and employing the schedule of compensating offsets to control the actual cutting paths to align and coincide with the desired cutting paths when desired cutting paths and corresponding cutting conditions arise.