The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2003

Filed:

Feb. 09, 2000
Applicant:
Inventors:

Mark Lucera, Pine Hill, NJ (US);

Frank Check, San Jose, CA (US);

C. Harry Knowles, Moorestown, NJ (US);

Xiaoxun Zhu, Philadelphia, PA (US);

LeRoy Dickson, Morgan Hill, CA (US);

Assignee:

Metrologic Instruments, Inc., Blackwood, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 7/10 ;
U.S. Cl.
CPC ...
G06K 7/10 ;
Abstract

A multi-focal zone laser scanning system for scanning bar code symbols having a minimum bar element width (MBW). The multi-focal zone laser scanning system comprises a laser beam producing device for producing a laser beam, and a laser beam scanning mechanism for scanning the laser beam so as to generate a laser scanning pattern having a plurality of different focal zones. In the system, the scanned laser beam has a minimum beam dimension (MBD) with each focal zone, and the ratio of the minimum beam dimension (MDB) within each focal zone to the minimum bar element width (MBW) of a scanned bar code symbol therewithin (i.e. MDB/MBW) is greater than or equal to 2.0. Consequently, less modulation of the laser scanning beam is required during scanning operations, and therefore, bar code symbols having narrower minimum bar element widths can be resolved.


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