The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2003

Filed:

Mar. 31, 2000
Applicant:
Inventors:

R. Daniel Costley, Oxford, MS (US);

Mark E. Henderson, Long Beach, MS (US);

Gary N. Dion, Madison, AL (US);

Assignee:

Mississippi State University, Mississippi State, MS (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/904 ;
U.S. Cl.
CPC ...
G01N 2/904 ;
Abstract

A method for inspecting concrete structures includes the steps of exciting the structure to be inspected with a mechanical device such as a chain, sensing resulting vibrations with an acoustical sensor such as a microphone that is not physically coupled to the structure, processing the received signals to exclude signals with frequencies outside of response frequencies of interest corresponding to defects desired to be detected, and examining the received signals. In preferred embodiments, the mean square of the processed signals are compared to a threshold. Areas for which the total energy across the frequency bands of interest exceeds the threshold correspond to defects such as delaminations. The received signals are collected from various locations on the structure. In preferred embodiments, the location of the received signals is also maintained. Also provided is an apparatus for inspecting concrete structures that comprises a mobile platform, such as a wheeled cart or trailer, to which is mounted an excitation device such as a chain, a microphone for receiving acoustic signals from the structure, and a computer for analyzing signals from the microphone.


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