The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2003
Filed:
Jul. 02, 2002
Yoshihito Niwa, Kyoto, JP;
Hiroshi Takagi, Otsu, JP;
Murata Manufacturing Co., Ltd., Kyoto, JP;
Abstract
A method for measuring the viscosity of a green compact sample includes the steps of finding a corrected value V′ of the sample volume of the green compact sample, where the corrected value V′ of the sample volume is a volume occupied by the inorganic powder in the green compact sample; finding a corrected value (dh/dt)′ of the sample deformation rate of the green compact sample, where the corrected value (dh/dt)′ of the sample deformation rate is the difference between the apparent sample deformation rate and the sample deformation rate due to sintering shrinkage; separating a temperature range X in which sintering shrinkage dominates and a temperature range Y in which plastic deformation dominates with respect to the displacement of the green compact sample; substituting the corrected value V′ of the sample volume for the sample volume V and substituting the corrected value (dh/dt)′ of the sample deformation rate for the sample deformation rate dh/dt in the Gent equation with respect to the temperature range X; and substituting the corrected value V′ of the sample volume for the sample volume V in the Gent equation with respect to the temperature range Y.